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KMID : 0381920150450010023
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Korean Journal of Microscopy
2015 Volume.45 No. 1 p.23 ~ p.31
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Dark-field Transmission Electron Microscopy Imaging Technique to Visualize the Local Structure of Two-dimensional Material; Graphene
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Na Min-Young
Lee Seung-Mo
Kim Do-Hyang
Chang Hye-Jung
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Abstract
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Dark field (DF) transmission electron microscopy image has become a popular characterization method for two-dimensional material, graphene, since it can visualize grain structure and multilayer islands, and further provide structural information such as crystal orientation relations, defects, etc. unlike other imaging tools. Here we present microstructure of graphene, particularly, using DF imaging. High-angle grain boundary formation wass observed in heat-treated chemical vapor deposition-grown graphene on the Si substrate using patch-quilted DF imaging processing, which is supposed to occur by strain around multilayer islands. Upon the crystal orientation between layers the multilayer islands were categorized into the oriented one and the twisted one, and their local structure were compared. In addition information from each diffraction spot in selected area diffraction pattern was summarized.
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KEYWORD
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Graphene, Transmission electron microscopy, Dark field image, Grain
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